Analysis of Non-Conductive Solid Samples by Laser Ablation Interfaced with Extended Dynamic Range HR-ICP-MS

[claudia-bouman]

1) Thermo Fisher Scientific, Bremen, Germany, 2) TDK Corporation, Material Analysis Center, Technology Group, Japan, 3) Thermo Fisher Scientific, Boulder, CO, USA
AN30103
Analysis of Non-Conductive Solid Samples by Laser Ablation Interfaced with Extended Dynamic Range HR-ICP-MS
Julian D. Wills (1), Meike Hamester (1), Masahiro Oishi (2) and Rob Henry (3)
This note describes the use of Laser ablation ICP-MS for the elemental analysis of non-conductive samples, such as ceramics. The Thermo Scientific Element XR with its increased linear dynamic range is ideally suited for such applications.

• HR-ICPMS
• Element XR 2
• Laser Ablation
• Ceramics